Horiba Jobin Yvon S.A.S.    

 

Address:

16/18 rue du Canal

Longjumeau, 91165 Cedex

France


Company description

Manufacturing: Manufacture of instruments for analysis and research using optical spectroscopy technology

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News and information about Horiba Jobin Yvon S.A.S.

Uspto Issues Trademark: Openplex
US Fed News Service, Including US State News; February 22, 2017; 339 words
...Feb. 22 -- The trademark OPENPLEX (Reg. No. 5140210) was issued on Feb. 14 by the USPTO.Owner: Horiba Jobin Yvon, SAS soci't' par actions simplifi'e (sas) FRANCE 16/18 Rue du Canal Longjumeau FRANCE 91160.The trademark...
Wipo Publishes Patent of Horiba Jobin Yvon for "Method for Analysing a Solid Sample by Flight Time Mass Spectrometry" (French Inventors)
US Fed News Service, Including US State News; June 6, 2016; 444 words
...Title of the invention: "METHOD FOR ANALYSING A SOLID SAMPLE BY FLIGHT TIME MASS SPECTROMETRY."Applicants: HORIBA JOBIN YVON SAS (FR).Inventors: Sebastien Legendre (FR), Agnes Tempez (FR) and Patrick Chapon (FR).According to...
Uspto Issues Trademark: Xelplex
US Fed News Service, Including US State News; February 26, 2016; 355 words
...XELPLEX (Reg. No. 4903454; International Reg. No 1270416) was issued on Feb. 23 by the USPTO.Owner: HORIBA JOBIN YVON SAS Soci't' par actions simplifi'e FRANCE 16/18 rue du Canal F-91160 LONGJUMEAU FRANCE.The trademark application...
Wipo Publishes Patent of Horiba Jobin Yvon for "Glow Discharge Spectroscopy Method and System for Measuring in Situ the Etch Depth of a Sample" (French Inventors)
US Fed News Service, Including US State News; November 9, 2015; 443 words
...GLOW DISCHARGE SPECTROSCOPY METHOD AND SYSTEM FOR MEASURING IN SITU THE ETCH DEPTH OF A SAMPLE."Applicants: HORIBA JOBIN YVON SAS (FR).Inventors: Simon Richard (FR), Jean-Paul Gaston (FR), Olivier Acher (FR) and Patrick Chapon...
Wipo Publishes Patent of Horiba Jobin Yvon for "Apparatus and Method for Optical Beam Scanning Microscopy" (French Inventors)
US Fed News Service, Including US State News; October 25, 2015; 458 words
...Oct. 22.Title of the invention: "APPARATUS AND METHOD FOR OPTICAL BEAM SCANNING MICROSCOPY."Applicants: HORIBA JOBIN YVON SAS (FR).Inventors: Emmanuel Fretel (FR), Damien Andrezejeusky (FR), Rene Boidin (FR) and Philippe De...
Wipo Publishes Patent of Horiba Jobin Yvon for "Process and Apparatus for Measuring an Organic Solid Sample by Glow Discharge Spectromety" (French Inventors)
US Fed News Service, Including US State News; October 12, 2015; 450 words
...PROCESS AND APPARATUS FOR MEASURING AN ORGANIC SOLID SAMPLE BY GLOW DISCHARGE SPECTROMETY."Applicants: HORIBA JOBIN YVON SAS (FR).Inventors: Patrick Chapon (FR), Agnes Tempez (FR) and Sebastien Legendre (FR).According to...
Wipo Publishes Patent of Horiba Jobin Yvon for "System and Method for Transferring a Fluid Sample in a Fluid Cell" (French Inventors)
US Fed News Service, Including US State News; September 3, 2015; 458 words
...Title of the invention: "SYSTEM AND METHOD FOR TRANSFERRING A FLUID SAMPLE IN A FLUID CELL."Applicants: HORIBA JOBIN YVON SAS (FR).Inventors: Emmanuel Maillart (FR), Cecile Lerondeau (FR), Geraldine Melizzi (FR), Didier...
US Patent Issued to Horiba Jobin Yvon on June 30 for "Device and Method for Observing and for Measuring Raman Scattering" (French Inventors)
US Fed News Service, Including US State News; July 1, 2015; 461 words
ALEXANDRIA, Va., July 1 -- United States Patent no. 9,068,889, issued on June 30, was assigned to Horiba Jobin Yvon SAS (Longjumeau, France)."Device and method for observing and for measuring raman scattering" was invented...

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Industry information

NAICS codes 
North American Industry Classification System (NAICS) codes are used to classify businesses for the purpose of collecting statistical data related to the U.S. economy. NAICS codes have been assigned to international companies to help organize all companies by type of activity.  

Primary: 334519 - Other Measuring and Controlling Device Manufacturing


 

SIC codes 
Standard Industrial Classification (SIC) codes classify establishments by their primary type of activity. SIC codes are a U.S. Census Bureau system but can apply to international companies.  

Primary: 3829 - Measuring and Controlling Devices, NEC industry report