KLA-Tencor Corp.    

 
NASDAQ: KLAC

Address:

1 Technology Dr.

Milpitas, CA 95035-7916

United States

Phone:
(408) 875-3000

Fax:
(408) 875-4144


Company description

KLA-Tencor Corporation was formed in April 1997 through the merger of KLA Instruments Corporation and Tencor Instruments, two long-time leaders in the semiconductor equipment industry that had originally begun operations in 1975 and 1976, respectively. It is headquartered in Milipitas, California. KLA-Tencor supplies process control and yield management solutions for the semiconductor and related microelectronics industries. Its products are also used in a number of other industries, including light emitting diode (LED) and data storage manufacturing and solar process development and control. Products and services include inline wafer and IC defect monitoring, review and classification; reticle defect inspection; packaging and interconnect inspection; critical dimension metrology; pattern overlay metrology; film thickness, surface topography and composition measurements; measurement of in-chamber process conditions, wafer shape and stressmetrology; computational lithography tools; and overall yield and fab-wide data management and analysis systems. In June 2008, KLA-Tencor completed its acquisition of ICOS Vision Systems Corporation NV, a Belgium-based company that provides packaging and interconnect inspection solutions for the semiconductor industry that also has a market leadership position in the inspection of photovoltaic solar technologies and LED wafers.

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News and information about KLA-Tencor Corp.

ResearchAndMarkets.com Offers Report: Film Thickness Measurement Market
Manufacturing Close-Up; February 24, 2018; 615 words
...Angstrom Sun Technologies Inc.-Bruker-Defelsko-Elcometer-Elektrophysik-Fischer Technology-Hamamatsu-Horiba-KLA-Tencor-Keyence-Lumetrics Inc.-Nanometrics-Otsuka Electronics-PCE Deutschland GmbH-Rudolph Technologies-Screen Holdings...
Wipo Publishes Patent of Kla-Tencor for "Optical Measurement of Opening Dimensions in a Wafer" (American Inventors)
US Fed News Service, Including US State News; February 19, 2018; 457 words
...was published on Feb. 15.Title of the invention: "OPTICAL MEASUREMENT OF OPENING DIMENSIONS IN A WAFER."Applicants: KLA-TENCOR CORPORATION (US).Inventors: James Jianguo Xu (US), Ronny Soetarman (US), Ken Kinsun Lee (US) and Nitigya Kathuria...
Wipo Publishes Patent of Kla-Tencor for "Off-Axis Reflective Afocal Optical Relay" (American Inventors)
US Fed News Service, Including US State News; February 19, 2018; 349 words
...031346 was published on Feb. 15.Title of the invention: "OFF-AXIS REFLECTIVE AFOCAL OPTICAL RELAY."Applicants: KLA-TENCOR CORPORATION (US).Inventors: Andrew V. Hill (US) and Gregory Brady (US).According to the abstract* posted by the...
Wipo Publishes Patent of Kla-Tencor for "Optical Measurement of Bump Hieght" (American Inventors)
US Fed News Service, Including US State News; February 19, 2018; 444 words
...2018/031574 was published on Feb. 15.Title of the invention: "OPTICAL MEASUREMENT OF BUMP HIEGHT."Applicants: KLA-TENCOR CORPORATION (US).Inventors: Ronny Soetarman (US) and James Jianguo Xu (US).According to the abstract* posted by...
Wipo Publishes Patent of Kla-Tencor for "Optical Measurement of Step Size and Plated Metal Thickness" (American Inventors)
US Fed News Service, Including US State News; February 19, 2018; 464 words
...published on Feb. 15.Title of the invention: "OPTICAL MEASUREMENT OF STEP SIZE AND PLATED METAL THICKNESS."Applicants: KLA-TENCOR CORPORATION (US).Inventors: James Jianguo Xu (US), Ronny Soetarman (US) and Budi Hartono (US).According to the...
Wipo Publishes Patent of Kla-Tencor for "Automated 3-D Measurement" (American Inventors)
US Fed News Service, Including US State News; February 19, 2018; 452 words
...No. WO/2018/031560 was published on Feb. 15.Title of the invention: "AUTOMATED 3-D MEASUREMENT."Applicants: KLA-TENCOR CORPORATION (US).Inventors: James Jianguo Xu (US) and Ronny Soetarman (US).According to the abstract* posted by...
The Latest: Walker Process Claims Don't Belong in the Federal Circuit
Mondaq Business Briefing; February 16, 2018; 669 words
...the Federal Circuit transferring a Walker Process claim to the Fifth Circuit for lack of jurisdiction. Xitronix Corp. v. KLA-Tencor Corp., Case No. 2016-2746 (Fed. Cir., Feb. 9, 2018) (Moore, J.). In Walker Process, the Supreme Court held...
Form 8-K: Kla Tencor Files Current Report
US Fed News Service, Including US State News; February 15, 2018; 355 words
WASHINGTON, Feb. 15 -- Kla Tencor Corp, Milpitas, Calif., files Form 8-K (current report) with Securities and Exchange Commission on Feb. 14.State of...

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Industry information

NAICS codes 
North American Industry Classification System (NAICS) codes are used to classify businesses for the purpose of collecting statistical data related to the U.S. economy. NAICS codes have been assigned to international companies to help organize all companies by type of activity.  

Primary: 333314 - Optical Instrument and Lens Manufacturing

334513 - Instruments and Related Products Manufacturing for Measuring, Displaying, and Controlling Industrial Process Variables


 

SIC codes 
Standard Industrial Classification (SIC) codes classify establishments by their primary type of activity. SIC codes are a U.S. Census Bureau system but can apply to international companies.  

Primary: 3827 - Optical Instruments and Lenses industry report

3823 - Industrial Instruments for Measurement, Display, and Control of Process Variables; and Related Products industry report